Features

• This Probe Unit is an inspection instrument designed to measure the electrical characteristics of Chip-type components.
• The Contact Section of the probe unit employs the contact spring developed for our Chip-type Delay Line Socket and so can be used as an automatic testing device for chip-type components at frequencies exceeding 10GHz.
• The Contact has a very long life expectancy（over 100k usages）; moreover, because the contact section is simply constructed, it can be easily replaced. The following illustrations are examples of the Probe Unit:
  
  

  ［Figure１：External Diagram］
  		Work Guide
  			SMA Connector
  ［Figure２：Contact Section（High-Frequency Section）］
  	Contact		Measurement Component
  		Microstrip Board
  ［Figure３：Impedance Control］
  		Microstrip Board GND surface
  	SMA Connector Lead Lower Surface		Grooves
  Probe units can be designed to meet the clients’ requirements. We will design your high-quality adaptor unit based on our impedance management technology from our Delay Line designs and your required electronic simulations. Several units can also be combined in order to allow multiple tests at one time. Please contact us with your requirements.

  Common Specifications(provisional)

  －3dB Passband:	DC～14GHz min（Contact Section）
  Contact Life Expectancy:	over 100k
  Operating Temperature Range:	-5°C to +55°C

  
  
  

  ELECTRONIC SIMULATION EXAMPLES

  Test Component： CDKF03C（ELMEC Delay Line） Adaptor Unit： based on the unit described above Characteristics are for the combined Test Component and Adaptor Unit.（Sdd21）